光伏组件及电池用EL测试仪
The award-winning SolarCell system utilizes the photoluminescence or alternatively the electroluminescence phenomena to image micro cracks, cell failures and inhomogenities of photovoltaic cells which are extremely difficult to detect visually. The equipment allows performing detailed quality control of single cells and wafers. It was developed for research and off-line industrial inspection.
The system consists mainly of a highly sensitive NIR CCD-Camera and an innovative HighPower LED light source, developed and manufactured by greateyes. The compact system is delivered with a light-tight enclosure. A computer system is available as an option.
Due to the high sensitivity of the detection system and the powerful LED light source, the system is capable of measuring Si-based as well as thin-film solar cells and wafers.
Software Overview:
The software controls the camera and visualizes the data sets. Intensity profiles of the 16 bit high dynamic range image data can be displayed in addition to basic picture manipulation procedures.
Moreover dimension measurements of artefacts are possible following calibration.
Software Functions:
• Save, quicksave, load images
• Supported file formats: BMP, JPEG, TXT and raw data
• Single image mode, video mode
• Automatic background subtraction
• False-color representation of images
• Intensity slices in x-, y-direction
• Linear / logarithmic scaling
• Zoom functions / image viewer
• Remote control of power supply
• Remote control of high-power LED light source
Software / Hardware Requirements:
• PC with Windows XP / Windows Vista / Windows 7 (32 bit)
• USB 2.0 interface
• Back-illuminated scientific CCD sensor
• High sensitivity in the near infrared region (85% @ 750nm, 40% @900nm, 12% @ 1000nm)
• Large pixel size of 13μm × 13μm
• Resolution: 1024 × 1024 Pixel
• High dynamic range of image data (16bit or 65536 greyscales)
• Hermetically sealed vacuum chamber
• Peltier cooling down to -20°C
• USB 2.0 interface
• Additional driver for LabView are available on request
Key Features of High Power LED Light Source:
• ~650nm centre wavelength
• Adjustable illumination intensity (max. 1sun)
• Illumination homogeneity better 90%
• Small footprint
• No cooling or maintenance necessary
• Operation remotely controlled by the software
Inspection Capabilities:
• Electroluminescence (EL)
• Reverse-bias EL
• Photoluminescence (PL)
• Biased PL (four-quadrant power supply necessary)
Areas of Application:
• Inspection of wafers, c-Si solar cells, Thinfilm-Substrates (c-Si, CIS, CIGS, a-Si, CdTe, HIT, ...)
• Identification/ replacement of defect cells
• Improvement of general production efficiency
• Research and development
• Characterization and qualification
Defect Inspection Capabilities:
• Shunt detection
• Micro-crack identification
• Cell print defects
• Solar cell rear side paste defects
• Detect inhomogeneities, impurities
• Solar cell / module efficiency classification
General Specifications:
System Components:
• USB 2.0 CCD camera : GE 1024 × 1024 BI MID
• High-end objective with enhanced NIR transmission
• High power LED light source (for PL measurements)
• Cell contact probe (for EL measurements)
• Attractive dark chamber with low glare by reflection
• LumiSolarCell software for detailed analysis of the images
• Preinstalled computer system
• Power supply and connection cables inclusive
Power Supply:
• Input: 100-240V, 50/60 Hz
• Output: 0-100V / 0-7.5A / 750W
• Remote-controlled via software
Computer System:
• Intel CPU Core i3, 4 GB DDR3 RAM, 500GB hard disk
• DVD writer, keyboard, mouse
• 24″ TFT Screen
Dimension and Weight:
• Size of housing (W: D : H): 850mm × 600mm × 1100mm
• Total Weight: 70kg
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