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Electroluminescence EL

EL and PL are non-destructive methods;EL and PL provide a high informative content, many types of defects can be clearly identified;Fast measurement on a second timescale;EL can be used to investigate small cells as well as large areas made from mono-Si, poly-Si, a-Si, micro-Si, CIGS, CIS, CdTe;Method can be integrated in the production process (in-line);EL and PL are also well suited for research and development of new photovoltaic devices

 

Electroluminescence (EL) method

An external current is applied to the solar cell or module using its electrical contacts. The invisible electroluminscence radiation emitted by the solar cell or module is detected by a highly sensitive camera.

To measure the electroluminescence of solar cells and modules the availability of electrical contacts are required. The whole value chain of solar industry can be inspected by electroluminescence and ranges from the inspection of processed solar cells, solar cell strings, control of pre-laminates and finished modules to the inspection of mounted solar modules in the PV plant. An overview of our high-performance optical inspection systems can be found here.
 

Examples

Inspection of Wafer, Solar Cells & Modules

Solar cells and solar modules suffer from a variety of invisible defects which reduce their output power and long-term stability. The highly sensitive Inspection Systems from greateyes image these problems. This allows you to optimize the production, increase output power and reduce overall costs.
 

Electroluminescence
An external current is applied to the solar cell or module using its electrical contacts. The invisible electroluminscence radiation emitted by the solar cell or module is detected by a highly sensitive camera.
Photoluminescence
The solar cell or wafer is excited by an intensive light source. No electrical connections to the solar cell are necessary. The invisible photoluminescence radiation emitted by the wafer or solar cell is detected by a highly sensitive camera.


Advantages of Electroluminescence (EL) and Photoluminescence (PL) Inspection 

  • EL and PL are non-destructive methods
  • Measurements deliver detailed information about defects and their location
  • EL and PL provide a high informative content, many types of defects can be clearly identified
  • Fast measurement on a second timescale
  • EL can be used to investigate small cells as well as large areas made from mono-Si, poly-Si, a-Si, micro-Si, CIGS, CIS, CdTe
  • Method can be integrated in the production process (in-line)
  • EL and PL are also well suited for research and development of new photovoltaic devices


Differences between Electroluminescence (EL) and Photoluminescence (PL) Inspection 

 

  Electroluminescence Photoluminescence
Requirements Electrical contacts are necessary. No electrical contacts needed.
Substrates Solar cells, strings, modules Wafers, solar cells, as-cut wafers
Materials mono-Si, poly-Si, a-Si, micro-Si, CIGS, CIS, CdTe mono-Si, poly-Si, a-Si. micro-Si, CIGS
Measurement time 0.2 - 1 sec for mono-Si or poly-Si 0.2 - 2 sec for mono-Si, poly-Si
Informative value Micro-cracks, shunts, finger defects, deposition problems, bad edge isolation, ... Micro-cracks, inhomogenities, impurities, dislocations